摘要
The cyclic voltammetry and chronoamperometry were used to study the influence of SiC particles on the nucleation and growth of nickel deposition on copper matrix from acid sulphate solution.The surface morphology of Ni-SiC co-deposition at initial stage was observed with scanning electron microscope(SEM).The results show that the nickel co-deposition with SiC particles may begin at -700 mV (vs SCE) under the experimental conditions,and the nucleation/growth mechanism of Ni-SiC co-deposition tends Scharifker-Hill with three-dimension model.In the case of low over-potential of -710-740 mV,the nucleation process of Ni-SiC co-deposition may follow the progressive nucleation mechanism of Scharifker-Hill.During higher over-potential of -770-800 mV,it trends to follow a 3D instantaneous nucleation/growth mechanism.With the increase of over-potential,the relaxation time tm,corresponding to the peak current Im of Ni-SiC co-deposition decreases regularly and is shortened apparently,compared with that of pure Ni deposition.The observation with SEM confirms that SiC particles can be considered as favorable sites for nickel nucleating.When certain amount of SiC particles are adsorbed (or cover) on cathode surface,especially under the condition of high over-potential,they may represent an external inhibition of the nickel electron deposition.
The cyclic voltammetry and chronoamperometry were used to study the influence of SiC particles on the nucleation and growth of nickel deposition on copper matrix from acid sulphate solution. The surface morphology of Ni-SiC co-deposition at initial stage was observed with scanning electron microscope(SEM). The results show that the nickel co-deposition with SiC particles may begin at -700 mV (vs SCE) under the experimental conditions, and the nucleation/growth mechanism of Ni-SiC co-deposition tends Seharifker--Hill with three-dimension model. In the case of low over-potential of -710--740 mV, the nucleation process of Ni-SiC co-deposition may follow the progressive nucleation mechanism of Scharifker--Hill. During higher over-potential of-770--800 mV, it trends to follow a 3D instantaneous nucleation/growth mechanism. With the increase of over-potential, the relaxation time tin, corresponding to the peak current Im of Ni-SiC co-deposition decreases regularly and is shortened apparently, compared with that of pure Ni deposition. The observation with SEM confirms that SiC particles can be considered as favorable sites for nickel nucleating. When certain amount of SiC particles are adsorbed (or cover) on cathode surface, especially under the condition of high overpotential, they may represent an external inhibition of the nickel electron deposition.
出处
《中国有色金属学会会刊:英文版》
EI
CSCD
2008年第5期1128-1133,共6页
Transactions of Nonferrous Metals Society of China
关键词
Ni-SiC薄膜
电子结晶成核
沉积原理
金属学
Ni-SiC film
electron crystallization nucleation
co-deposition mechanism
I--t curve