复杂光电系统可靠性鉴定试验方案研究

Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems

针对复杂光电系统实际情况，依据可靠性试验理论，分析了指数寿命型假设的统计检验，阐述了可靠性定时和定数截尾鉴定试验，以及定时试验标准方案，探讨了故障加权处理、试验剖面与综合环境条件，对复杂光电系统可靠性鉴定试验方案设计及质检验收有一定的指导意义。

For complex optoelectronic systems,this paper,according to theory of reliability testing,analyzes statistical test for exponential life hypothesis,describes fixed time and fixed number censored reliability testing,and fixed time testing standard scheme,discusses weighted failuress and test profile,combined environment condition.It plays directive roles of scheme design of reliability qualification test and production acceptance for complex optoelectronic systems.