摘要
采用直流磁控溅射法在载玻片上制备Cr/Gd/Cr薄膜。利用XRD和VSM对薄膜的微观结构和低温磁特性进行研究。结果表明:薄膜的TC=297K,高于块体Gd的TC=293K,薄膜中的铁磁层Gd与反铁磁层Cr的自旋在界面表现出铁磁耦合特征,当温度分别在80～200K和250～290K时,矫顽力和交换偏置场随温度表现出正常的变化规律,但温度为200～250K时,随温度的升高,Gd的自发磁矩方向发生变化,铁磁相Gd与反铁磁相Cr之间的耦合作用减弱,表现出交换偏置场减小、矫顽力增大的反常变化。
The Cr/Gd/Cr films were deposited on glass substrate by DC magnetron sputtering method. The microstructure and magnetic properties of the films were characterized by means of X-ray diffraction （XRD） and Vibrating-sample magnetometer （VSM）. It was shown that the Curie temperature Tc （297 K） of the film is higher than the Tc （293 K） of the bulk Gd. It was observed that the spins of the ferromagnetic Gd layer exchange with the spins of the antiferromagnetic Cr layer at the interface by ferromagnetic couple. The temperature dependence of coercivity and exchange bias field exhibit normal behaviors at the temperature ranges of 80-200 K and 250-290 K; however, the exchange bias field decreases and the coercivity increases anomalously with the increase of temperature, respectively, at the temperature range of 200-250 K, which is due to the fact that the direction of the spontaneous moment of Gd varies with the temperature and leads to the decrease of the exchange interaction between the Gd and Cr .
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2008年第9期1578-1581,共4页
Rare Metal Materials and Engineering
基金
国家自然科学基金(10574109
50701037)
