片式电感器筛选方法

Analysis of Screening Scheme for Chip Inductors

概述了电感器的发展历程,重点介绍模压片式电感器、叠层片式电感器的结构特点,以及工艺条件对固有可靠性的影响,并对以上两种类型电感器主要失效模式及其失效机理进行了简要分析,针对电感器三种主要失效模式:电性能参数退化、开路、短路,设计了模压片式和叠层片式电感器的筛选方案,并取得一定效果。

This paper summarizes the development of the inductors, focuses on the structural characteristics of the molded chip inductors and muhilayer chip inductors, and impact of process conditions on the inherent reliability. A brief analysis was made on the main failure mode and failure mechanism of the two types of inductors mentioned above. According to the three main failure mode, electric performance parameter degradation, open circuit and short circuit, we designed a screening scheme for the moulded chip inductors and muhilayer chip inductors, and obtained the certain effect.