摘要
本文采用电感耦合等离子体全谱发射光谱仪直接测定精镉中Pb、Zn、Fe、Cu、TI、As、Sb,SnO研究了分析线。的选择,酸度条件和基体干扰情况。该方法的相对标准偏差为1.60%-5.96%,样品加标回收率为93%~105%,简便、快速,测定结果令人满意。
The paper has used to directly measure Pb,Zn,Fe,Cu,TI, As,Sb and Sn in refined Cadmium (Cd) by IRIS Advantage. And selection of analysis line, conditons of acidness and interference situations of main sampling mattters has been studied in the paper. The relative standard deviation of the measuring method is in the range of 1.60% - 5.96%. The measuring methods are simple, quick and the results has been satisfied with us.
出处
《甘肃冶金》
2008年第5期73-75,共3页
Gansu Metallurgy
关键词
ICP-AES
精镉
杂质元素
基体干扰
ICP-AES
refined cadmium
.elements of foreign matter
interferences of main sampling matters