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Z箍缩等离子体X射线极化研究

Polarization of the X-ray Line Emission of Plasmas Excited by Z-pinch
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摘要 针对z箍缩等离子体辐射的X射线光谱极化信息,研制了适用于z箍缩装置的X射线晶体谱仪。分光晶体使用云母(002)材料,布拉格衍射角范围为30°~60°。利用该谱仪在相互正交的方向分别对等离子体发射的X射线进行检测,用X射线胶片接收光谱信号。探测实验在中物院阳加速器装置上进行,实验结果表明,谱仪在相互正交的两个方向都获取了氩的类氦谱线。对比两方向X射线强度,有显著的差别。计算了氩的类氦共振线w、磁四级M2跃迁X线、互组合跃迁Y线及禁戒谱线z线的极化度,实验证明Z箍缩等离子体具有明显的各项异性。 In order to diagnose the polarization of the x-ray line emission of plasmas excited by Z-pinch, a X-ray line polarization spectrometer is developed for measuring the spectrums. With Mica (002) crystal as dispersive element, Bragg angle is in the range of 30°-60 °. X-ray lines radiated by plasma are measured in the vertical and horizontal directions, respectively. The X-ray spectra Of lines in Ar XV 11 are photographed by using the polarization spectrometer with X-ray film on Yang accelerator. We obtain the resonance line w, the magnetic quadrupole M2 line, the intercombination line y and the forbidden line z in the vertical and horizontal directions. The experimental spectra recorded by the spectrometer are apparently different in the vertical and horizontal directions. The degree of polarization of lines w, x, y and z is calculated to show anisotropic property and the presence of beams in Z-pinch plasmas.
出处 《光电工程》 EI CAS CSCD 北大核心 2008年第10期32-36,共5页 Opto-Electronic Engineering
基金 国家自然科学基金NSAF联合基金资助项目(10576041)
关键词 Z箍缩 等离子体诊断 晶体谱仪 极化光谱 Z-pinch plasma diagnosis crystal spectrometer polarization spectrum
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参考文献15

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