同步辐射计算机断层技术光源误差机理分析

Error mechanism of light source for synchrotron radiation computed tomography technique

基于同步辐射X射线的优越特性及计算机断层重建技术对材料无损检测等优点,同步辐射计算机断层重建技术被广泛应用于很多领域.本文对光源非均匀、过饱和以及过穿透的三种情形所引起同步辐射计算机断层技术重建误差的形成机理进行了分析研究,给出了三种情形所引起误差的基本形式.在此基础上,对这三种误差进行了数值模拟,模拟结果证实了分析的正确性.

Based on the unique advantages of synchrotron radiation X-ray with high resolution and collimation, and the advantage of nondestructive observation of computed-tomography technique, synchrotron radiation computed tomography technique is widely used in many fields. In this paper, the errors caused by light source such as unevenness, supersaturation and super penetration are studied for synchrotron radiation computed tomography technique, and its three basic error forms are given. Numerical simulation results confirm this analysis.