嵌入式计算机的BIT设计与实现

Design and Implementation of BIT for Embedded Computer

依据嵌入式计算机组成特点,在可测试性设计中采用层次式测试硬件结构,通过分布式测试控制管理,实现从器件级、模块级到子系统级、系统级的逐级测试。在BIT测试中,以CPU测试为例解析了测试用例数据、用例过程、执行控制和判决的组织与实现。

According to the characters of embedded computer, this paper adapts the hierarchy structure for testing hardware in DFT, and implements the self-test under the management of distributed test control, from chip-level, module-level to subsystem-level, system-level. As an example for BIT design, this paper gives CPU test, explains the organization and implementation of test case data, test case procedure, execution control and test decision.