摘要
本文报道溅射工艺、退火工艺和冷却方式对磷扩散法制备的p型ZnO薄膜的微观结构和电学特性的影响的实验研究。研究结果表明,ZnO薄膜的表面形貌、结晶度、内应力以及电学特性均与制备工艺条件有密切的关系。文章对这些关系的机理做了探讨和分析。
Techniques including magnetron sputtering, annealing, and cooling for preparing p-ZnO thin films by phosphorus diffusion and their influence on the microstructure and electric characteristics of the films have been studied in this article. Results of the research reveal that the morphology, crystallinity and electric characteristics of the p-ZnO films have close relations to the preparation techniques of the films. Mechanisms of the relations have been discussed and analyzed.
出处
《人工晶体学报》
EI
CAS
CSCD
北大核心
2008年第5期1237-1241,1272,共6页
Journal of Synthetic Crystals
基金
广东省自然科学基金(No.04011770)
江门市科技计划(江财企【2004】59号)
关键词
ZNO薄膜
工艺条件
微观结构
电学特性
p-ZnO films
preparation techniques
microstructure
electric characteristics