常用数字芯片检测装置开发

Developping of the Detecting Device for Common Use Figure Chip

以单片机89 s52为核心,由可编程I/O接口、E2PROM、RAM、键盘和LED显示器等组成数字集成电路故障检测系统。介绍了使用单片机设计的集成芯片测试装置的工作原理及软硬件设计,该系统具有自动识别实验室常用TTL及CMOS数字芯片型号和测试其是否完好的功能。

Cored with MCU 89s52, the figure IC fault detect system is composed of programable I/O interface, E^2PROM, RAM, keyboard and LED display. The operating principle, software and hardware design of the IC chips detecting device designed by MCU are introduced. The system can identify automatically types of TTL and CMOS figure chips common used in laboratory and test these chips performances.