基于DPSO的改进AO^＊算法在大型复杂电子系统最优序贯测试中的应用

Applying Improved AO^＊ Based on DPSO Algorithm in the Optimal Test-Sequencing Problem of Large-scale Complicated Electronic System

针对大型复杂电子系统最优序贯测试问题,提出一种基于离散粒子群算法（DPSO）和改进AO^＊算法相结合的方法.DPSO优化AO^＊算法中每个要扩展节点的测试集从而减少测试个数;改进AO^＊算法通过规定扩展节点估价值的范围,减少其回溯次数.实例验证表明,该算法不仅有效地降低了计算复杂度,大大减少测试代价,缩短测试时间,而且避免了原有AO^＊算法当备选的测试集太大时容易出现“计算爆炸”的缺点.

An algorithm of improved AO^＊ based on discrete binary particle swarm optimization （DPSO） is proposed, which can solve the Optimal Test-sequencing problem in large-scale complicated electron system. DPSO optimizes the test sets which can isolate the expanded node in AO^＊ algorithm to decrease the number of node; The improved AO^＊ limits the test cost range of node and lessens the traces. The result of real operation show that this algorithm not only reduces the computational complexity, cuts down the test cost, shorten the test time; but also avoids the ＂computational explosion＂ when the test set is too large.