X-射线衍射与火焰原子吸收法联合测定ZnS∶Mn薄膜屏中Mn含量

Analysis of Mn Content in ZnS∶Mn from AC Electroluminescent Film Screen Using XRD and FAAS

提出一种X-射线衍射(XRD)与火焰原子吸收法(FAAS)联合测定ZnS∶Mn交流电致发光(ACEL)薄膜中Mn含量的新方法。首先用XRD测定ZnS薄膜的结构,判断薄膜是否符合它的化学式量,在符合化学式量基础上,再用FAAS分别测定Zn与Mn的质量分数,最终确定Mn在ZnS薄膜中的含量。与单独采用FAAS测定相比较,测定结果的相对误差,相对标准偏差相同。但是,该方法具有样品处理简单,分析周期短,所需样品量少等优点。不仅可以提供Mn在ZnS薄膜中的含量与构成质量,同时也可以对ZnS∶Mn交流电致发光膜薄的浓度分布以及均匀度提供客观的评价指标,以利于镀膜工艺中各参数指标的改善。

A method for determining Mn content in AC-electroluminescent thin-film of ZnS： Mn was established by combining XRD with FAAS. When the sample of ZnS conformed to the chemical formula, structure of ZnS was made sure with XRD, then, content of manganege and zinc was determined with FAAS. As compared with usual method that determined content of zinc or manganese using FAAS, this method is the same in both relative error and standard deviation. Moreover, it is much better than other ones, which can give an objective appraisal of average form for AC-electroluminescent film screen of ZnS. This method is simple and rapid, its cycle of analysis is short and the consumed amount of sample is less.