期刊文献+

浸没式阵列激光扫描直写光刻 被引量:1

Laser Array Direct Scanning Photolithography with Immersion Lens
下载PDF
导出
摘要 介绍一种以显微镜结构为基础的浸没式阵列激光扫描直写光刻系统的光路结构、有效焦深、自动调焦及曝光能量控制的原理和方法。实验系统的有效数值孔径(ENA)为1.83,使用的激光波长为355nm时,在实验室条件下得到的最细线条宽度为65nm。 The principles and methods of the optical system, efficiency focus depth, auto focusing, exposure energy con(rol of a laser array direct scanning microlithography system with immersion lens are described in this paper. The efficiency numerical aperture is 1.83. The minimal line width is 65nm with 355nm laser beam scanning photolithography in laboratory.
出处 《电子工业专用设备》 2008年第10期1-9,共9页 Equipment for Electronic Products Manufacturing
关键词 阵列激光扫描 浸没式镜头 直写光刻 Array laser scanning Immersion lens Direct Photolithography
  • 相关文献

参考文献1

二级参考文献5

  • 1[1]Christopher Lacey, Rick Shelor, et al.. Interferometric measurement of disk/slider spacing: the effect of phase shift on reflection. IEEE Transactions on Magnetics,1993,29(6):3906~ 3908.
  • 2[2]Yao-long Zhu,Bo Liu. Flying height measurement considering the effects of the slider-disk interaction. IEEE Transactions on Magnetics, 2000,36 (5): 2677 ~ 2679.
  • 3[3]Dick Henze, Paul Mui, et al.. Multi-channel interferometric measurements of slider flying height and pitch.IEEE Transactions on Magnetics, 1989, 25 (5): 3710~3712.
  • 4[4]Sadao Mori, Hiroyuki Sugawara, et al.. Effective refractive index method for frustrated total reflection:application to measurement of flying height. IEEE Transactions on Magnetics, 1998,34 (2): 568~ 574.
  • 5[5]Kishimak. Near-field phase-change optical recording over 1.2-numerical-aperture. SPIE, 1999,3864: 355~357.

同被引文献14

  • 1J M Bustillo, R T Howe, R S Muller. Surface micromachining for microelectromechanical systems[J].IEEE, 1998,86(8): 1552-1574.
  • 2K L Gunderson, S Kruglyak, M S Graige. Decoding randomly ordered DNA arrays[J].Genome Research, 2004,14(5): 870-877.
  • 3A W Martinez, S T Phillips, G M Whitesides. Three-dimensional microfluidic devices fabricated in layered paper and tape[J].Proc. the National Academy of Sciences, 2008,105(50): 19606-19611.
  • 4Christof Klein, Elmar Platzgummer, Hans Loeschner, et al.. Projection maskless lithography for 22 nm half-pitch and below[C].SPIE, 2009, 10.1117/2.1200902.1528.
  • 5Xijun Li, Kazuya Terabe, Hideki Hatano, et al.. Domain patterning thin crystalline ferroelectric film with focused ion beam for nonlinear photonic integrated circuits[J].J Appl Phys, 2006,100(10): 1234001.
  • 6Gang Luo, Guoyong Xie, Yongyi Zhang, et al.. Scanning probe lithography for nanoimprinting mould fabrication[J].Nanotechnology, 2006,17(12): 3018-3022.
  • 7Richard D Piner, Jin Zhu, Feng Xu, et al.. “Dip-pen” nanolithography[J].Science, 1999, 283(5402): 661-663.
  • 8J Koch, E Fadeeva, M Engelbrecht, et al.. Maskless nonlinear lithography with femtosecond laser pulse[J].Appl Phys A, 2006, 82(1): 23-26.
  • 9Liang Pan, Yongshik Park, Yi Xiong, et al.. Maskless plasmonic lithography at 22 nm resolution[J].Scientific Reports, 2011, 1: 1-6.
  • 10Donald K Cohen, Wing Ho Gee, M Ludeke, et al.. Automatic focus control: the astigmatic lens approach[J].Appl Opt, 1984, 23(4): 565-570.

引证文献1

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部