高能X射线双能成像系统中多能谱探测器研究

Research on multi-spectrum detector in High-energy dual-energy X-ray imaging system

高能X射线双能成像系统能够对被检物的材料进行识别,但是当被检物的质量厚度较小时,对其材料识别变得很困难。本文提出了利用多能谱探测器的方法,来提高对较薄材料的识别能力,并使用蒙特卡罗方法进行了一系列模拟计算,首先计算了探测器晶体厚度变化时X射线的沉积规律,然后计算了不同探测器结构和参数情况下材料识别的效果。从模拟计算的结果可知,采用适当的多能谱探测器将使得系统对质量厚度较小的物质,尤其是高Z材料的识别效果有明显改善。

The high-energy dual-energy X-ray imaging system can discriminate the material of the objects inspected, but when the objects are too thin, the discrimination becomes very difficult. This paper proposes the use of multi-spectrum detector to improve the ability to discriminate thin material, and a series of simulation were done with the Monte Carlo method. Firstly the X-ray depositions in the detectors with different thickness were calculated, and then the discrimination effects with different detector structure and parameters were calculated. The simulation results validated that using appropriate multi-spectrum detector can improve the discrimination accuracy of thin material, particularly thin high-Z material.