摘要
随着光电耦合器件在空间环境和核辐射领域的广泛应用,近年来对光电耦合器件的抗辐照性能的研究越来越多。文章主要介绍了辐照对光电耦合器的损伤机理,重点介绍了光电耦合器的辐照效应,特别是电参数辐照效应;针对光电耦合器目前研究的情况,分析了其研究趋势,并提出了一种新的光电耦合器辐照研究方法———低频噪声可靠性表征方法。
As wide applications of optocouplers in space environment and nuclear radiation, more and more researches focus on its anti-irradiation characteristics. The irradiation damage mechanism is presented, especially the electric irradiation effect. According to the research status, its developing trends are analyzed and a new method for analyzing irradiation, lowfrequency noise reliability characterization, is proposed.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2008年第5期621-624,630,共5页
Semiconductor Optoelectronics
关键词
光电耦合器
辐照效应
辐照损伤机理
optocoupler
irradiation effect
irradiation damage mechanism
