摘要
提出了一种基于形状的检测准则的发光二极管(LED)芯片位置检测系统,利用数字图像处理技术进行LED芯片位置非接触检测,通过图像的获取、图像的定位和分割、边缘检测及轮廓提取等,从而得到被测芯片的精确位置。通过实验证明了该系统的可行性和正确性。
A new LED chip testing system based on detecting rule of shape is developed. Using digital graphic disposal technology, the locations of LED chips are tested without touch, including images acquisition, orientation and segmentation, edge detection and outline collection, etc. Experiments prove the feasibility and correctness of the system.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2008年第5期722-724,728,共4页
Semiconductor Optoelectronics
基金
国家"863"计划项目(2006AA03A139)
关键词
发光二极管
定位
分割
轮廓
LED
orientation
segmentation
outline
