摘要
生命期测试和筛选测试在开发和生产半导体激光器中是一个重要的测试过程。尽管这些测试过程原则上很简单,实际上这些测试过程因激光器的差异而变得十分复杂,要求较低的花销,要求在延长的时间中有高稳定的测量方式。在过去的30年里,已经开发出了设备和技术来支持这个技术领域。
Life-test and bum- in are important test processes in the development and manuiheturing of laser diodes. Although these test processes are simple in principle, actual tests are complicated by the diversity of laser types, requirements for low cost, and the need for high - stability measure- ments over prolonged periods of time. Over the past three decades, equipment and techniques have evolved to support this interesting area of technology.
