摘要
讨论了铁电薄膜记忆特性的检测方法，研制了专用的测试仪器，并利用它测试了Ａｕ／ＢＩＴ／ＰＬＺＴ／ＢＩＴ／ｎ－Ｓｉ铁电薄膜的记忆性能．
A method for testing memory characteristics of ferroelectric films is discussed.A special instrument based on it is developed and the memory characteristic of a sample has been got by the instrument.
出处
《中南民族学院学报（自然科学版）》
1997年第4期1-4,共4页
Journal of South-Central University for Nationalities(Natural Sciences)
基金
激光技术国家重点实验室基金
关键词
铁电薄膜
非易失性记忆
测试
记忆性能
存储器
ferroelectrics
nonvolatile memory
test Sun Fenglou Assoc.Prof.,Dept.of Electronic Engineering,SCCFN,Wuhan 430074
