摘要
本文介绍了JZR型偏光熔点仪的检测原理和软硬件结构。该仪器的检测原理系利用晶体的二色性。当结晶性有机物样品置于两正交偏振片的光场中时,在加热样品使其熔化的过程中,其结晶态变化,由于晶体的二色性,随着熔化过程中有机物结晶的消失,由透光变为不透光、供出明显的熔点特征信息。整机采用微机化设计,可对多个样品进行自动等速升温控制、自动打印熔化过程曲线、自动判别熔点。软件编程量达汇编程序12K字节。经使用证明,在技术指标和性能价格的方面,优于国际名牌产品瑞士METTLER FP—85型熔点仪。文中还给出了该仪器的软硬件原理及结构。
The measuring principle and the software and hardware structures of a polymer polarimetric melting point measuring instrument are presented. The measurement is based on the birefringence property of semi-crystalline polymers. When organic specimen put in the optical field of two crossed polaroseopes is heated, its crystal state will change. The specimen is no longer transparent, but becomes opaque with the disappearing of crystalline due to melting of the substance. The instrument adopted a computerized design. It can control temperature rise of multiple samples at a constant rate, print the curve of melting process, and judge the melting point automatically. The word length is 14 kbyte in assembly language.
出处
《分析仪器》
CAS
1989年第1期17-20,共4页
Analytical Instrumentation
