基于FPGA+ADSP的线阵CCD非接触测量系统

A non-contact linear CCD measuring system based on FPGA and ADSP

提出了基于FPGA和ADSP的线阵CCD非接触测量技术。选用线阵CCD作为前端信号采集;采用FPGA产生与控制整个系统的时序:CCD工作时序、A/D转换时序、ADSP采集数据同步时序;采用多次扫描平均方法形成一维数字图像;利用DSP高速图像处理性能并设计高性能的浮动阈值二值化算法对其处理。给出了时序仿真图,满足系统的时序要求;并给出了测量物体的波形。通过对光学系统的定标最终给出了物体的长度。数据表明,相比传统的测量系统,该系统具有高速和高精度的优点。

A non-contact linear CCD measuring system based on FPGA and ADSP technology is proposed. The system utilizes linear CCD as the signal acquisition frontend. FPGA provides time sequences such as CCD working sequences, A/D conversion timing and synchronized timing for ADSP to collect data. Multiple sampling and averaging methods are used to produce one-dimensional digital photographs in virtue of DSP/s high-speed performance and highperformance of float threshold binaryzation algorithms. The simulation timing chart, and the signal＇s oscillograph trace of the survey object are given out. The simulation timing satisfies system＇s need. Finally through the calibration for the optical system the object＇s length is achieved. The experimental data indicates that the measuring system has high speed and high precision performance.