激光诱导薄膜损伤的缺陷统计模型与光斑效应

The Defect statistical Model of Pulse Laser-induced Damage to Thin-film and Spotsize Effocts

讨论了脉冲激光诱导薄膜损伤的缺陷统计模型，在对该模型加些适当的限制条件后，运用它解释光斑效应，发现该理论模型与实验结果符合得很好。

The defect statistical model of pulse laser induced damage to thin-film are discussed. After some appropriate limited conditions are given to the model, we use it to interpret spotsize effects, we find the theory model fits experimental data very well.