摘要
介绍了SOC中微处理器核的几种测试方法(并行测试法,串行测试法,测试接口控制器(TIC)法和内建自测试法)和SOC微处理器核的调试支持,并着重介绍了其中测试接口控制器(TIC)法和内建自测试法两种方法的具体实现。
This paper introduces several testing techniques (parallel testing technique, serial testing technique, testing technique of testing interface controller(TIC) and build -in self testing technique)and debugging surport of SOC microprocessor core, furthermore emphasize concrete realizition of two testing techniques as testing technique of testing interface controller(TIC)and build- in self testing technique.
出处
《微处理机》
2008年第4期15-16,共2页
Microprocessors