CMOS集成电路电气参数测试方法研究

Shallow to Talk About CMOS Integrated Circuit Tests

随着大规模集成电路自动测试设备的出现,自动测试技术被广泛应用,实现了高效率的集成电路产品验证,这就使得应用自动测试设备有了一定的流程。首先对CMOS集成电路电气参数的典型测试流程进行介绍,然后对基本测试方法及可能的测试结果逐项加以说明。

With the appearance of VLSI ATE, Auto test technology has been wide used, So production of IC validation is efficiency,This paper has introduced the typical flow of test in IC electric parameter, Then explain the basic principle of test and imaginable result.