薄膜电容器的失效分析和试验方法

Failure Analysis and Test Methods of Film Capacitors

薄膜电容器失效的主要原因在于其保护层防潮性能不好和实际应用中存在交流电。文中先介绍薄膜电容器的生产工艺和电子镇流器的使用环境,再介绍潮湿对电容器的危害作用,以及电容器的失效分析。作者运用详细的原理解释,结合用不同的潮湿试验条件和施加直流电压或交流电压的方法来评估薄膜电容器的实际承受能力,通过优化选择和数据对比,得出结论"85℃,85%RH,施加交流电压"是最有效的试验方法。总之,增强防潮和抗交流电能力可以保证薄膜电容器以及电子镇流器处于高质量水平。

Film capacitors failure＇ s main causes were from their poor anti-moisture ability of protective layers and existed AC voltage in real applications. This paper firstly introduced the manufacture processes of film capacitors and using conditions in electric ballasts, then about moisture＇ s bad effects to capacitors and their failure analysis. The writer used detailed theory explanations, combined to use different moisture test methods and apply DC or AC voltage to evaluate the film capacitors＇ real withstanding ability. Through preferred choice and data comparison, he concluded that ＂85℃, 85%RH, applying AC voltage＂ was the most effective, In short, the improvement on ability of anti-moisture and anti-AC voltage could make film capacitors and electric ballasts at the top quality level.