摘要
重用高质量的集成电路知识产权模块(IP)能够显著地提高设计效率和芯片质量,基于质量标准的IP评测能够衡量和提高IP质量.提出并实现了一种基于QIP标准的可扩展IP质量评测辅助系统——IPqML.该系统参考软件质量度量理论改进了传统评测流程,实现了层次化的质量评测体系结构.采用XML Schema技术描述质量模型,并用于生成评测流程配置信息;通过使用模板技术实现工具配置自动化和可扩展机制,IP评测结果存储在XML文档中.最后在该系统原型上完成了3个商用IP核的评测.实验结果表明,该系统能够有效地提高评测效率和结果准确性.
Integrated circuit intellectual property or IP with high quality can prominently improve design productivity and product quality. IP qualification based IP quality standards can improve the quality of IPs. We proposed and implemented an IP qualification framework based on QIP standard. The framework has a layered architecture with reference to the software quality metric theory, and the framework is more extendibility than traditional qualification flow. XML Schema technique is used to describe the quality model and the configuration information of qualification flow is generated from models. Automation and extendibility are implemented based on template technology. The qualification results can be stored in XML files. The experimental results on three commercial IPs demonstrated that the qualification framework can accelerate the qualification process and improve accuracy of qualification results.
出处
《计算机辅助设计与图形学学报》
EI
CSCD
北大核心
2008年第12期1563-1568,共6页
Journal of Computer-Aided Design & Computer Graphics
基金
香港创新及科技基金(ITS/139/03)