摘要
采用有限元分析方法研究了碲镉汞红外焦平面器件在低温下由于不同热膨胀系数引起的热失配应力,提出了两种焦平面器件结构,可以有效地降低热应力,并应用于实际器件的制备,明显提高了碲镉汞焦平面器件的可靠性.
Thermal mismatch stress for HgCdTe infrared focal plane array was analyzed by finite elements method. According to the analyzing results, two configurations of infrared focal plane array were proposed to reduce the thermal mismatch stress effectively. The reliability of HgCdTe infrared focal plane array was raised obviously.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
2008年第6期409-412,共4页
Journal of Infrared and Millimeter Waves
基金
国防预研(42201030102)资助项目
关键词
红外焦平面
HGCDTE
热应力
可靠性
infrared focal plane array
HgCdTe
thermal stress
reliability
