基于一维缺陷光子晶体的角度测量仪的设计

A Design for the Angle Measurement Device With 1D Defect Photonic Crystal

提出用一维缺陷光子晶体来测量角度特别是小的角度变化的设计方案。用Si薄膜和SiO2薄膜组成一维缺陷光子晶体,用特征矩阵法研究该光子晶体的禁带中的缺陷模的波长和强度随入射角缓慢变化而变化的规律,由此提出根据缺陷模的波长、强度、偏振性与入射角的关系进行角度测量的原理。本设计特别适用于极小的角度变化的测量。

In this paper we put forward a design for the angle measurement device with 1-D defect photonic crystal. The 1-D defect photonic crystal is made up of Si thin film and SiO2 thin film. We investigate the variety law of the defeet modes as the incident angle has small changes by means of eigen matrix. Accordingly we put forward three ways of angle measurement：using the relationships between the wavelength of defect modes and incident angle, using the relationships between the transmittances of defect modes and incident angle and using the relationships between the polarizations of defect modes and incident angle. The virtue of our design is that it can measure very small angle change precisely.