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相容类加权的扩展相容性扫描树构造算法 被引量:1

Extended Compatibility Scan Tree Construction Algorithm Based on Compatible Clique with Weight
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摘要 针对基于相容类加权的扩展相容性扫描树构造算法在生成相容类时存在的问题,对其进行3个方面的改进:选取包含X的扫描单元,选取度更小的扫描单元生成异或类,异或类再进行异或生成新的异或类。实验结果表明,该改进算法是有效的。 In terms of the problems in extended compatibility scan tree construction algorithm based on weighted compatible clique when creating compatible clique, three improvements of this algorithm are proposed by following rules: to select the scan cells which have more Xs in its test vector, to select the scan cells which have smaller degree to create XOR clique, and to allow an XOR clique to create other new XOR clique. Experimental results show this improved algorithm is more effective.
出处 《计算机工程》 CAS CSCD 北大核心 2008年第24期241-243,共3页 Computer Engineering
基金 国家自然科学基金资助项目(60673085 60773207)
关键词 全扫描测试 扫描树 测试应用时间 测试数据量 full-scan test scan tree test application time test data volume
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参考文献4

  • 1Hamzaoglu I, Patel J. Reducing Test Application Time for Full Scan Embedded Cores[C]//Proc. of the 29th Annual Int'l Conf. on FTCS. [S. l.]: IEEE Press, 1999.
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同被引文献4

  • 1You Zhiqiang,Yamaguchi K,Inoue M,et al.Power-constrained Test Synthesis and Scheduling Algorithms for Non-scan BIST-able RTL Data Paths[J].IEICE Trans.on Information & Systems,2005,E88-D(8):1940-1947.
  • 2Stroele A.A Self Test Approach Using Accumulators as Test Pattern Generators[C]//Proc.of Int'l Symp.on Circuits and Systems.Seattle,USA:[s.n.],1995:2120-2123.
  • 3Voyiatzis I.A Low-cost BIST Scheme for Test Vector Embedding in Accumulator-generated Sequences[M].[S.1.]:Hindawi Publishing Corporation,2008.
  • 4刘志华,尤志强,张大方,成永升.扩展相容性多扫描树的设计[J].计算机工程,2008,34(22):234-235. 被引量:1

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