期刊文献+

单场限环结构击穿电压的表面电荷效应分析 被引量:4

Analysis of Breakdown Voltage for Surface Charge Effect on Floating Field Limiting Ring Structure
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摘要 本文利用计及表面电荷的柱面结电场分布表达式,并根据场限环优化条件,首次建立了单场限环表面电荷效应优化模型,得到了考虑表面电荷效应后,优化单场限环结构击穿电压以及优化环间距的归一化计算公式.分析了表面电荷密度对场限环结构耐压和优化环间距的影响,计算结果与文献中的数值模拟结果相符合。 Abstract In this paper,the normalized expressions of breakdown voltage and optimum ring spacing of single floating field limiting ring(FFLR) structure are derived by use of the formula of eletric field including the surface charge in the cylindrical P + N junction.The accuracies of the analytical expressions are verified by comparison with the mumerical simulation results in the published paper.This approach can be used directly and conviently in the optimum design for FFLR’s structures.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 1998年第1期38-42,共5页 半导体学报(英文版)
基金 国家自然科学基金
关键词 场限环结构 功率器件 表面电荷效应 Electric breakdown Optimization
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参考文献2

  • 1陈星弼,功率MOSFET与高压集成电路,1990年
  • 2陈星弼,电子学报,1988年,16卷,5期,14页

同被引文献22

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