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基于ADC的时钟jitter测试平台的研究 被引量:1

A clock jitter generation and measurement platform
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摘要 本文实现了一种利用高速模数转换器(ADC)采样测量时钟jitter的硬件测试平台。文中针对高速、高分辨ADC的特性,导出时钟Jitter对输出码密度的影响,根据这层关系可以反推出时钟Jitter的大小。同时介绍了如何在硬件上产生高速、可以控制的时钟jitter。最后通过ModelSim和Matlab对这个平台进行仿真分析,结果表明这种方法不需要高性能仪器,且具有高分辨和低时耗等特点。 In this paper, we propose a hardware-based platform for clock jitter generation and measurement based on high-speed ADC. The effects of jitter on high-speed and high-precision ADC's output are introduced, as the theoretical basis of jitter deducing. The method of generating high-speed and controllable clock jitter is also included. Emulation of this platform using ModelSim and Matlab shows, that it takes only a small measuring time, and can achieves high precision without high perfomance devices.
出处 《电路与系统学报》 CSCD 北大核心 2008年第6期13-17,共5页 Journal of Circuits and Systems
基金 国家自然科学基金资助项目(10505020)
关键词 模数转换 时钟晃动 码密度 加性高斯噪声 ADC clock jitter CDF AWGN
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参考文献9

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同被引文献5

  • 1赵继勇,彭飞.高速ADC的低抖动时钟设计[J].电子设计应用,2005(2):79-80. 被引量:7
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  • 314 Bit, 125 MSPS Analog-to-Digital Converter[M].ADS5500 Data Sheet, 13-17.
  • 4ZANCHI A, BONFANTI A, LEVANTINO S, et al.General SSCR vs.cycle-to-cycle jitter relationship with application to the phase noise in PLL[J].Proceedings of the 2001 IEEE Southwest Symposium on Mixed-Signal Design,2001 (2): 32-37.
  • 5ZANCHI A, PAPANTONOPOULOS I, TSAY F.Measurement and Spice prediction of sub-picosond clock jitter in A/D converters[J].Proceedings of the 2003 IEEE International Symposium on Circuits and Systems,2003(5):557-560.

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