摘要
针对自动测试系统中存在的测试程序可互换性差、可移植性不强的问题,提出了一种新的仪器驱动器设计模型,采用IVI面向信号(IVI-SD)模型,同时利用COM技术对模型进行扩展。该模型实现了测试程序在仪器更换后不必重新编写,改善了自动测试软件的通用性、互换性,为解决自动测试系统的软件可移植性问题提供了一种新的思路。
For improving the interchangeability of ATE, a new instrument driver model is designed based on IVI-SD model and IVI-COM model. The soft-platform＇s extensibility is improved for it is not necessary to rewrite the test program when the instruments changed. The instrument driver model meets the needs of generality and interchangeahility of automatic test equipment software.
出处
《国外电子测量技术》
2008年第12期10-13,共4页
Foreign Electronic Measurement Technology
