广义可靠性增长过程及其控制方法研究

Research of generalized reliability growth process and its control method

针对传统的可靠性增长仅针对试验中暴露的缺陷进行纠正,忽略了产品寿命周期早期信息的问题,探讨了在产品全寿命周期过程中对分析、试验暴露出的缺陷进行改进以提高产品可靠性的广义可靠性增长方法,给出了广义可靠性增长的基本概念、基本过程和基本内容,着重强调了广义可靠性增长的组织流程及闭环控制手段,并对比了广义可靠性增长与传统可靠性增长的关系,说明通过广义可靠性增长,有助于在全寿命周期过程中提高产品可靠性。

Traditional reliability growth only tries to correct failures which are exposed by testing,so a lot of useful information in the early life cycle was ignored. It discusses generalized reliability growth, which could improve product reliability by redesigning products to eliminate failures uncovered during both analyzing and testing process in its whole life cycle. It explains the basic concept,process and content of the generalized reliability growth,and emphasizes its organizing flow and closed-loop control method. Further,the differences of generalized reliability growth,reliability growth test,reliability growth management and general reliability growth were compared. The result shows that generalized reliability growth could contribute to better product reliability in the entire life cycle.