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Simulation Investigation on Particle Transmission Characteristics of Two Different Ion Barrier Films

Simulation Investigation on Particle Transmission Characteristics of Two Different Ion Barrier Films
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摘要 The simulation calculation and analysis of electron transmittance and ion stopping power for ion barrier films (IBFs) of Al2O3 and SiO2 are performed by Monte Carlo methods. The interaction model between particles and solids are described. It is found that at the same conditions,the electron transmittance for SiO2 IBF is relatively higher than that of Al2O3 IBF,and the ion stopping power of SiO2 IBF is relatively lower than that of Al2O3 by Monte Carlo simulations. It is also indicated that SiO2 is one of the ideal materials for fabricating IBFs. The simulation calculation and analysis of electron transmittance and ion stopping power for ion barrier films (IBFs) of Al2O3 and SiO2 are performed by Monte Carlo methods. The interaction model between particles and solids are described. It is found that at the same conditions, the electron transmittance for SiO2 IBF is relatively higher than that of Al2O3 IBF, and the ion stopping power of SlOE IBF is relatively lower than that of Al2O3 by Monte Carlo simulations. It is also indicated that SiO2 is one of the ideal materials for fabricating IBFs.
机构地区 School of Science
出处 《Defence Technology(防务技术)》 SCIE EI CAS 2008年第4期268-271,共4页 Defence Technology
关键词 真空电子学 电子物理学 光电子学 激光 optoelectronics and laser ion barrier film microchannel plate Monte Carlo simulation
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参考文献10

  • 1TIAN Jing-quan,JIANG De-long,FU Li-chen.MCP amorphous Al2O3electron transmitting fil ms[].Acta Electrinic Sinica.1996
  • 2DUANMU Qing-duo,JIANG De-long.Research on MCP electron transmission fil mand its particle transmis-sion characteristics[].Acta Electrinic Sinica.2005
  • 3Dapor M.Backscattering of lowenergy electronsfromcarbon films deposited on aluminum:a Monte Carlo si mulation[].Journal of Applied Physics.2004
  • 4Drouin D,Couture A R,Joly D,et al.CASI NO V2.42—a fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users[].Scan-ning.2007
  • 5Littmark U,Ziegler J F.Ranges of energetic ions in matter[].Physical Review.1981
  • 6Ziegler J F.Stopping of energeticlight ionsin elemental mat-ter[].Applied Physics Reviews.1999
  • 7Zou Yisong.Vacuum imaging devices and theoretical analysis (in Chinese)[]..1989
  • 8Timoty W Sinor and Joseph P Estrare.An Analysis of electron Scattering in thin dielectric used as ion barriers in Generation Ⅲ image tubes[].Proceedings of SPIE the International Society for Optical Engineering.2003
  • 9Illes P.Csorba.Recent advancements in the field of image intensification:the generation 3 wafer tube[].Applied Optics.1979
  • 10E.J. Bender,Joseph P. Estrera.High-reliability GaAs image intensifier with unfilmed microchannel plate[].Proceedings of SPIE the International Society for Optical Engineering.1999

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