摘要
本文基于遗传进化的原理，提出了用于优化计算的遗传梯度法与遗传退火法，给出了每一算法的实现方案，讨论了它们在电路测试图形生成中的应用。理论分析与实验结果说明所提出算法的性能优于原有方法，具有潜在的应用价值。
Based on the principle of genetic algorithm, this paper investigates genetic de-scent algorithm and genetic annealing algorithm that can be used in optimization computation,and discusses their applicatlons in circuit test pattern generation. The performances of conven-tional descent algor1thm and simulated annealing algorithm have been improved in convergenceand computing time by genetic operations. The experimental results show the effectiveness ofthe proposed algorithms.
出处
《电子测量与仪器学报》
CSCD
1998年第1期12-17,共6页
Journal of Electronic Measurement and Instrumentation
基金
国家"八五"攻关基金
关键词
最优化
遗传进化
遗传梯度法
遗传退火法
测试生成
Optimization
Genetic descent algorithm
Genetic annealing algorithm
test generation
