摘要
在计算光学切片显微成像(COSM)的非盲图像复原中,准确获取系统点扩展函数对图像复原质量和复原结果的稳定性有重要影响。显微镜系统的点扩展函数的获取通常有两种方式:数值计算和物理测量。数值计算运算量大,涉及的参数较多且难以准确估计,因而在实际应用中具有一定的局限性;物理测量得到的点扩展函数最能真实体现显微镜系统的光学特性,但其存在着信噪比(SNR)低的缺点,使用之前必须对其进行预处理。针对物理测量得到的点扩展函数详细讨论了如何运用扩展Nijboer-Zernike理论(ENZ)来对测得的点扩展函数进行重建。实验证明,该方法能快速准确地重建显微镜的三维点扩展函数,提升其信噪比。
In the non-blind image restoration of the computational optical sectioning microscopy (COSM), the acquisition of accurate point spread function of the system has a major impact on the quality and the stability of image restoration. There are two ways to access the point spread function in general., numerical calculation and physical measurements. Numerical calculation has heavy computational burden and more parameters which always cannot be accurately estimated, hence, it has some limitations in practical application; the point spread function accessed by physical measurements can embody the optical properties of the microscope system most properly, but it has low signal-to-noise ratio (SNR), it must be pre-processed before used. A detailed introduction of the principle about how to use the extended Nijboer-Zernike theory (ENZ) to reconstruct the point spread function accessed by physical measurements is given. Experiments proved that this method can rapidly and accurately reconstruct the 3D point spread function of the microscope and raise its SNR.
出处
《光学学报》
EI
CAS
CSCD
北大核心
2009年第1期169-175,共7页
Acta Optica Sinica
基金
国家自然科学基金(60372079)
教育部重点项目(107094)资助课题
关键词
光学测量
显微镜点扩展函数
拟合
泽尼克多项式
optical measurement
point spread function of microscopy
fitting
Zernike polynomials