摘要
The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are overlapped.It make us hard to quantitatively calculate.This paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped signals.By the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal defects.This method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.
The SF6 decomposed products are very alike,so the peaks of the SF6 decomposed products are overlapped.It make us hard to quantitatively calculate.This paper introduced a method to separate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function,and deduced the formula of the iterative curve-fitting;provided a method to calculate the initial value of the peaks intensity and width by iterative formula,and confirm the final peaks intensity and width to separate the overlapped signals.By the analysis of the real chromatogram data,it proved the validity of this method on the main components used in distinguishing the GIS internal defects.This method overcomes the influence of SF6 peak to the other thin concentration peaks,so it can be used in the study of the quantitative analysis of the decomposed products on different failures and different voltages.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2008年第12期2708-2712,共5页
High Voltage Engineering
基金
Project Supported by National Natural Science Foundation of China ( 50777070), Science and Technique Project of Chongqing (CSTC, 2007AC2041 ).
关键词
曲线拟合法
SF6分解组分
重叠色谱峰
分离
高斯函数
SF6 decomposed products
overlapped chromatogram peaks
iterative curve-fitting
Gauss function
GIS internal defects