摘要
目的探讨大鼠脑二次损伤（SBI）c-los、bcl-2、bcl—xL基因表达和细胞凋亡关系。方法40只大鼠随机分为正常对照组10只、脑缺血组10只、颅脑损伤组10只和SBI组10只，以免疫组织化学方法，检测脑神经细胞中c-fos、bcl-2、bcl-xL的表达水平；以原位细胞凋亡（TUNEL）法检测神经细胞凋亡水平。结果颅脑损伤组、SBI组皮层区c-fos基因表达（23．6±9．4）、（37．1±5．5）阳性细胞数／个／H均明显高于脑缺血组（5．6±1．4）阳性细胞数／个／H（t=3．458，t=3．648，均P〈0．01）；颅脑损伤组、SBI组皮层区bcl-2基因表达（18．2±4．6）、（15．6±3．7）阳性细胞数／个／H低于脑缺血组（23．6±4．3）阳性细胞数／个／H（t=2．345，t=2．447，均P〈0．05）；脑缺血组、颅脑损伤组和SBI组bcl-xL基因表达变化不大；SBI组皮层区细胞凋亡（36．6±5．3）个细胞／0．1mm^2高于颅脑损伤组（21．6±4．4）个细胞／0．1mm^2（t=2．378，P〈0．05）；细胞凋亡水平与bcl-2表达均呈负相关（r=-0．857，P〈0．01）。结论脑二次损伤c-fos、bcl-2、bcl-xL基因表达增加并与神经细胞凋亡水平密切相关。
Objective To explore the expression of c-fos,bcl-2,bcl-xL gene and apoptosis in rats with diffuse brain injury combination secondary injury（SBI）. Methods 40 rats were randomly divided into the normal control group 10,10 cerebral ischemia,head injury group 10 and group 10 SBI to immunohistochemical method to detect brain cells in the c-fos,bcl-2,bcl-xL expression and in-situ to apoptosis（TUNEL）. Results The expression of brain injury group and SBI group of cortex area c-fos gene （23.6 ± 9.4）, （ 37. 1 ± 5.5 ） positive eells/entries/H was significantly higher than that of cerebral ischemia group （5.6 ± 1.4） positive cells/entries/H （ t = 3. 458, t = 3.648, all P 〈 0. 01 ） ;the expression of brain injury group and SBI group cortex area bcl-2 gene （ 18.2 ± 4. 6 ）, （ 15.6 ± 3.7 ） positive cells/entries/H lower than that brain blood group （ 23. 6 ± 4. 3 ） positive cells/entries/H （ t = 2. 345, t = 2. 447 ,all P 〈0.05） ;the expression of bcl-xL gene changes little;the apoptosis SBI group cortex area （36. 6 ±5.3） cells/0. 1 mm^2 higher than the brain injury group （ 21.6 ± 4. 4 ） cells/0. 1 mm^2 （ t = 2. 378, P 〈 0. 05 ） ; the apoptosis and level of bcl-2 expression showed a negative correlation （ r = - 0. 857, P 〈 0.01 ）. Conclusion The expression of c-fos, bcl-2, bcl-xL were increased with closely related to apoptosis in rats with diffuse brain injury combination secondary injury.
出处
《中国基层医药》
CAS
2008年第11期1834-1836,共3页
Chinese Journal of Primary Medicine and Pharmacy
