用光波导方法测量Ⅱ—Ⅵ族半导体的光学非线性和光学双稳

MEASUREMENT FOR OPTICAL NONLINEARITY AND OPTICAL BISTABILITY IN Ⅱ—Ⅵ SEMICONDUCTOR BY OPTICAL WAVEGUIDE METHOD

本文报道利用光波导方法在ＧａＡｓ衬底上制备的Ⅱ—Ⅵ族半导体单晶薄膜和超晶格中所观测到的光学吸收、光学非线性和瞬态光学双稳的实验结果。

The untransparent substrates on the epitaxial layer need not be etched out from chemistry etching to prepare the “window” through light.The optical absorption,optical nonlinearities and optical bistabilities of the semiconductor thin films with the nanostructure grown on the untransparent substrates can be directly measured by the end face coupling method of optical waveguide.Meanwhile,the several experiment examples of Ⅱ—Ⅵ single crystal thin films and superlattices grown on GaAs substrate are demonstrated in this paper.