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非线性模拟电路的故障诊断方法 被引量:12

A Fault Diagnosis Method for Non-linear Analog Circuits
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摘要 为了诊断非线性模拟电路中的故障,提出了一种基于节点电压增量线性相关性原理的诊断方法.通过对非线性元件的分段线性建模,说明故障造成的节点电压增量满足分段线性相关性.以节点电压平面上的折线作为故障特征构造故障字典,以实测工作点到故障特征折线的距离来衡量电路状态与故障特征的符合程度,可以诊断非线性电路中元件参数的软故障和硬故障.实例验证表明,该方法是一种易于计算机实现的实用化方法. For diagnosing faults in non-linear analog circuits, a fault diagnosis method is proposed based on the principle of linear relativity of node-voltage increments. By piecewise linear-modeling of non-linear elements, the changes in node-voltages caused by faults are shown to be piecewise linearly related. Broken lines in the node-voltage plane are taken as fault character to construct a fault dictionary, and the distance from the test result point to each broken line is calculated to measure the accordance of the circuit status to the fault character. In this way both soft and hard faults in non- linear circuits can be diagnosed. Experimental results indicated that the proposed method is practical to be implemented in computer.
出处 《计算机辅助设计与图形学学报》 EI CSCD 北大核心 2009年第1期1-5,共5页 Journal of Computer-Aided Design & Computer Graphics
基金 国家"九七三"重点基础研究发展计划项目(2005CB321604) 国家自然科学基金(60773142) 教育部博士点基金(20070003122)
关键词 非线性电路 线性相关性 故障诊断 故障字典 non-linear circuit linear relativity fault diagnosis fault dictionary
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参考文献10

  • 1Li F, Woo P Y. The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method [J]. IEEE Transactions on Circuits and Systems Ⅰ: Fundamental Theory and Applications, 1999, 46 (10) : 1222-1227
  • 2Wang P, Yang S Y. Soft fault test and diagnosis for analog circuits [C] //Proceedings of IEEE International Symposium on Circuits and Systems, Kobe, 2005:2188-2191
  • 3汪鹏,杨士元.电压增量的线性相关性及在电路测试中的应用[J].清华大学学报(自然科学版),2007,47(7):1245-1248. 被引量:17
  • 4彭敏放,何怡刚.容差模拟电路的模糊软故障字典法诊断[J].湖南大学学报(自然科学版),2005,32(1):25-28. 被引量:16
  • 5Liu F, Nikolov P K, Ozev S. Parametric fault diagnosis for analog circuits using a Bayesian framework [C] //Proceedings of the 24th IEEE VLSI Test Symposium, Berkeley, 2006: 272-277
  • 6Tadeusiewicz M, Halgas S. Multiple fault diagnosis in analogue circuits [C]//Proceedings of the 2005 European Conference on Circuit Theory and Design, Cork, 2005: Ⅲ/ 205-Ⅲ/208
  • 7Miura Y, Kato J. Fault diagnosis of analog circuits based on adaptive test and output characteristics [C] //Proceedings of the 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Arlington, 2006:410-418
  • 8Yuan H Y, Chen G J, Shi S B, et al. Research on fault diagnosis in analog circuit based on wavelet-neural network [C]//Proceedings of the 6th World Congress on Intelligent Control and Automation, Dalian, 2006:2659-2662
  • 9Sun Y K, Chen G J, Li H. Analog circuits fault diagnosis based on support vector machine [C] //Proceedings of the 8th International Conference on Electronic Measurement and Instruments, Xi'an, 2007: 3-630-3-634
  • 10黄洁,何怡刚.模拟电路故障诊断的发展现状与展望[J].微电子学,2004,34(1):21-25. 被引量:58

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