X射线荧光分析在岩屑录井中的应用

The application of XRF analysis to logging

通过典型岩石化学的理论计算分析了部分沉积岩的成分特征和差别,为X射线荧光(XRF)录井分析鉴别岩性奠定了理论基础。地层在岩性组合与厚度上的差别是XRF录井技术鉴定地层的基本前提。根据沉积岩薄层岩层的厚度,提出以分米作为XRF录井取样的最低分辨率的标准。并以实例论述了在石油钻井的随钻过程中,采用XRF录井新技术进行岩性分析和地层对比的步骤;评价和展望了XRF录井新技术的特点与应用远景;指出建立不同岩性主要元素理论数据库和地区性地层岩性变化元素理论剖面的重要性;提出进一步改进XRF录井技术的方向。

The authors analyzed chemical characteristics and differences between sedimentary rocks, and the results obtained have established the application basis for X-ray fluorescence （XRF） analysis in logging, which is a new logging technique called XRF-logging. The differences in lithologic characters and thicknesses of strata provide a prerequisite for the stratigraphie analysis with the XRF-Logging technique. It is proposed in this paper that the decimeter should be used as the criterion of the lower sampling limit for the XRF-logging technique. A practical procedure for identifying lithologic character and judging horizons using the XRF-logging technique is illustrated in this paper, and a prediction of the application vista of the XRF-logging technique is also given. It is pointed out that the main element database of sedimentary rocks and stratigraphic profiles should be established for further application of the XRF-logging technique.