摘要
本文介绍一套既具备电子背散射衍射(EBSD),又具备应力加载功能的分析测试方法,简称原位EBSD。采用该系统能实现对拉伸、压缩、弯曲及剪切变形过程中材料的微观组织演变进行原位跟踪观察;可以分析材料在变形过程中的组织演变过程,获得组织演变的连续性信息,从而对研究材料变形过程中的机理及物理本质提供有力的实验依据。本文还以原位压缩过程中纯镁的微观组织演变的测试与分析为例,说明原位EBSD系统使用方法。
This paper introduced the in-situ EBSD analysis method for the microstructure observation of materials during plastic deformation. The system include a microtest system installed inside a scanning electron microscope (SEM) fitted with an EBSD camera. Microstructure evolution during tension, compression, shearing and bending could be studied by using the in-situ EBSD. And the microstracture evolutions of pure Mg under compression were investigated in this study as a sample.
出处
《电子显微学报》
CAS
CSCD
2008年第6期439-442,共4页
Journal of Chinese Electron Microscopy Society
基金
国家重点基础研究发展计划(973计划)(No.2007CB613703)
上海市自然科学基金资助项目(No.07zr14051)