期刊文献+

由EBSD谱三维重构晶体的Bravais点阵 被引量:2

3D reconstruction for Bravais lattice of unknown crystals using EBSD pattern
下载PDF
导出
摘要 本文提出了利用电子背散射衍射(EBSD)技术确定块状晶体未知点阵的新思路,详细介绍了从EBSD谱中的二维面信息到三维空间的重构算法,利用超定方程组,由菊池带宽度及其夹角信息,求出三维倒易初基胞的晶胞参数。结果表明,用单张EBSD花样完全可以解析未知晶体的Bravais点阵类型及晶胞参数。 A new method to determine unknown lattice of bulk crystals based on electron backscattered diffraction technique has been proposed in the present work. The arithmetic to reconstruct a three-dimensional reciprocal primitive cell in a Kikuchi pattern was introduced in detail. By using overdetermined equations, the parameters of the reciprocal primitive cell were solved according to the information obtained from the width and azimuth of the Kikuchi bands. The results demonstrate that the Bravais lattice type and parameters of unknown crystals could be successfully achieved by means of single electron backscattered diffraction pattern.
出处 《电子显微学报》 CAS CSCD 2008年第6期499-505,共7页 Journal of Chinese Electron Microscopy Society
基金 山东省自然科学基金(No.Y2006F61) 教育部留学回国人员科研启动基金资助项目
关键词 电子背散射衍射 未知晶体 三维重构 BRAVAIS点阵 electron backscattered diffraction unknown crystals three-dimensional reconstruction Bravais lattice
  • 相关文献

参考文献8

  • 1Dingley D J, Baba-Kishi K Z, Randle V. Atlas of Backscattering Kikuchi Diffraction Patterns [ M ]. In : Cantor B, Goringe M J eds. Bristal:Inst of Phys Publishing, 1995.
  • 2Nakamachi E, Ariyoshi T, Kobayashi Y, Hirose M, Morimoto H S. SEM-EBSD experimental and finite element analyses of plastic deformation induced crystal rotation of pure aluminum single crystals [ J ]. Transactions of the Japan Society of Mechanical Engineers Part A, 2003,69: 817- 822.
  • 3陈绍楷,李晴宇,苗壮,许飞.电子背散射衍射(EBSD)及其在材料研究中的应用[J].稀有金属材料与工程,2006,35(3):500-504. 被引量:48
  • 4Perez M G, Kenik E A, O' Keefe M J, Miller F S, Johnson B. Identification of phases in zinc alloy powders using electron backscatter diffraction [J]. Materials Science and Engineering A ,2006,424:239 - 250.
  • 5Goehner R P, Michael J R. Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns [ J]. Journal of Research of the National Institute of Standards and Technology, 1996, 101:301 - 308.
  • 6Randle V. Application of electron backscatter diffraction to grain boundary characterization [ J ]. International Materials Reviews,2004,49 : 1 - 11.
  • 7韩明,孔芳芳,姜学波,尹文红,王卫国.EBSD谱重构晶体的三维倒易初基胞[A].第二届全国电子背散射衍射技术及其应用会议论文集[C].包头:中国体视学学会材料科学分会,2007.154-162.
  • 8Dahlquist G,Bjorck A.数值方法[M].包雪松译.北京:高等教育出版社,1990.

二级参考文献3

  • 1HKL Technology Group.2003 EBSD Applications Catalogue[C],Denmark:HKL Technology,2003.
  • 2Ge Kexin(郭可信),Ye Hengqiang(叶恒强),Wu Yukun(吴玉琨).Applications of Electron Diffraction Patterns in Crystallography(电子衍射图在晶体学中的应用)[M].Beijing:Science Press,1983.
  • 3Huang Xiaoying(黄孝瑛).透射电子显微学[J],Shanghai:Shanghai Science and Technology Press,1987.

共引文献49

同被引文献13

  • 1韩明,孔芳芳,姜学波,尹文红,王卫国.EBSD谱重构晶体的三维倒易初基胞[A].第二届全国电子背散射衍射技术及其应用会议论文集[C].包头:中国体视学学会材料科学分会,2007.154-162.
  • 2Lassen N C K. Automatic high-precision measurements of the location and width of Kikuchi bands in electron backscatter diffraction patterns [ J ]. Journal of Microscopy, 1997,190:375 - 391.
  • 3Krieger Lassen N C,Juul Jensen D, Conradsen K. Image processing procedures for analysis of electron back scattering patterns [ J ]. Scanning Microsc. , 1992,6 : 115 - 121.
  • 4Dingley D J, Baba-Kishi K Z, Randle V. Atlas of Backscattering Kikuchi Diffraction Patterns [ M ]. Bristol:IOP, 1995.
  • 5Schwartz A J, Kumar M, Adams B L. Electron Backscatter Diffraction in Materials Science [ M ]. New York : Academic/Plenum Publishers ,2000.
  • 6Dingley D J,Wright S I. Determination of crystal phase from an electron backscatter diffraction pattern [ J ]. Applied Crystallography ,2009,42:234 - 241.
  • 7DahlquistG,BjorckA(包雪松译).数值方法[M].北京:高等教育出版社,1990.
  • 8Dingley D J,Baba-Kishi K Z,Randle V.Atlas of Backscattering Kikuchi Diffraction Patterns[M].Bristol:IOP,1995.
  • 9Perez M G,Kenik E A,O'Keefe M J,et al.Identification of phases in zinc alloy powders using electron backscatter diffraction[J].Materials Science and Engineering A,2006,424:239-250.
  • 10Goehner R P,Michael J R.Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns[J].Journal of Research of the National Institute of Standards and Technology,1996,101:301-308.

引证文献2

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部