摘要
介绍了测量晶体的最大双折射率温度系数的偏光干涉法.利用分光光度计测量出不同温度下晶体波片的偏光干涉谱.通过对不同温度下谱线极值点所对应波长的精确判断,准确计算出相应的最大双折射率,并由曲线拟合得到最大双折射率温度系数的表达式.测量的双折射率精度可达到10-5.
A polarized interference method is presented according to polarized interference principle. Firstly, the polarization interference spectrums of crystal wave-plate are measured with spectrophotometer at different temperatures. Then by accurately identifying the extreme points of the polarization interference spectrums, the maximal birefringent index of wave-plate can be calculated exactly. At last, the expressions of the temperature coefficients of the maximal birefringent index of crystal are obtained by curve-fitting. The accuracy of birefringent index is 10^-5 , which offered an accurate and simple method for measuring birefringent index and its temperature coefficient.
出处
《物理实验》
北大核心
2009年第2期34-36,40,共4页
Physics Experimentation
关键词
晶体光学
温度系数
偏光干涉
双折射率
crystal optics
temperature coefficient
polarized interference
birefringent index
