半导体发光器件的可靠性预计模型

Reliability Prediction Modeling of Semiconductor Light Emitting Device

文中介绍了一种基于概率方法的半导体发光器件可靠性预计模型。在初始光发射性能给定而退化特性通过试验确定的前提下,使用该模型可得到器件的可靠度函数关系,且理论预计结果与试验结果一致性良好。(对初始光发射性能和退化特性建模的研究仍在进行中,在本文中不涉及。而本模型最终将包括上述两部分的建模,以得到完整的可靠性预计解析结果。)对于半导体发光器件,本研究作为基于失效物理的一套完整的可靠性预计方法研究中的重要一步,提供了一种可行的方法,并且证明在器件性能基本参数基础上确定可靠度函数关系的途径具有可行性。

This paper presents a probabilistic-approach-based reliability predation model of semiconductor light emitting devices. Using this model with given initial light-emitting performance and degradation bahavior otherwise determined by experiment, the reliability function of the devices is obtained, and the results correlate well with experimental results. （Modeling the initial light-emitting performance and the degradation behavior is still an on-going effort and isnot included in this paper, Eventually, this model will include both parts of the modeling to provide complete analytical results of reliability ptediction.） This study is e step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.it provides an approach and proves the feasibility of determining a reliability function based on fundamental parameters of device performance.