液晶面板取向层与液晶层界面的电荷累积效应分析

Analysis of the Flaw of Electric Charges Accumulation between Alignment Layer and Liquid Cystal Layer of Liquid Crystal Cell

TN模式的电荷累积缺陷,是液晶显示器生产中一个相当棘手问题。由于累积电荷量难于定量测量来进行研究,所以该问题一直悬而未决。着重分析了液晶显示器电荷累积缺陷,发现当它们介电常数与电导率的比值相差越大,电荷积累值越大;当取向层的介电常数与电导率的比值和液晶的不相等时,二者的交界面将产生电荷积聚;并且发现当取向层的介电常数与电导率的比值和液晶的相等时,二者的交界面将不产生电荷积聚,图像残留、显示速度减慢等问题也就可以消除。

Since the application of liquid crystal begun in 1960s, the related manufacturing technology has already been considerably mature, but there are still many problems to desiderate to be resolved. The charge-accumulation of TN-LCD is the one of quite intractable problems in producing of LCD. Because quantitative measurement of charge-accumulation is hard to be done, the problem is still up in the air. Here the charge accumulation of LCD was analyzed from the opinion of the dielectric physics in this paper, and it was found that the accumulated charge can be produced in the interface when the ratio of dielectric constant and conductivity for alignment layer doesn＇t equal to that of LCD layer. The larger the ratio of dielectric constant and conductivity, the higher charge accumulation, and if the ratio of dielectric constant and conductivity equals to each other, there is no charge to be accumulated, this will be helpful to solve the problems such as image sticking, slow response etc.