摘要
本文列出了i线和g线大数值孔径亚微米投影光刻物镜的技术指标要求,讨论了这类超高精度光刻物镜的光学装校技术特点,报告了计算机辅助高精度复杂光学系统偏心校正仪器和方法,最后给出了i线和g线光刻物镜装校检测结果。
The technical specifications about large digital apperture sub micro i line and g line photolithographic lenses are listed. The key points on the optical assembly and rectification of super precision photolithographic lenses have been discussed. The computer aid measuring instrument and method for centre errors in the high performance optical system are reported. The testing results of i line and g line photolithographic lenses.
出处
《光学技术》
EI
CAS
CSCD
1998年第3期63-66,共4页
Optical Technique
关键词
投影光刻物镜
光学装校
微电子学
亚微米
photolithographic lenses, optical assembly and rectification, centre error measuring.