摘要
通过对０００ＭｅＶＡｒ离子辐照聚酯（ＰＥＴ）薄膜潜径迹蚀刻过程的研究，给出了表征ＰＥＴ聚合物材料特性的径迹可蚀刻性的能损阈值（ｄＥ／ｄＸ）ｃ，并通过不同方法讨论了ＰＥＴ膜的径迹蚀刻速度和体蚀刻速度。
The energy loss effect in the latent track etching process of PET films irradiated by 900MeV argon ions is discussed. The critical energy-Ioss rate (dE/dX). which is characteristic of the material(PET) is also given. The bulk etching rate Vb and track etching rate Vt are obtained with different methods.
出处
《核技术》
CAS
CSCD
北大核心
1998年第1期27-30,共4页
Nuclear Techniques
关键词
PET
潜径迹
氩离子辐照
固体径迹探测器
PET latent track, Ar ion irradiation, Critical energy-loss rate, Etching rate
