星用SRAM型FPGA的故障模式分析和容错方法研究

Fault Mode Analysis and Fault Tolerant Methodology for SRAM-Based FPGA on Spacecraft

静态存储器(SRAM,static random access memory)型现场可编程门阵列(FPGA,field programmable gate array)是一种对空间辐射效应较为敏感的航天器电子元器件。由于其特有的构造和工作方式,单粒子辐射效应对SRAM型FPGA造成的影响及其引起的故障模式有着区别于一般电子元器件的特征。为了提高SRAM型FPGA在空间应用中的可靠性,以该类型FPGA的主流器件作为研究对象,深入分析了FPGA在空间应用中的各种故障模式,研究了相应的各种容错方法。研究表明,通过采取适当的FPGA容错方法,能够有效降低SRAM型FPGA因空间辐射而发生故障的可能性。

The SRAM-based FPGA is one of the on- board electrical addition, effects devices susceptible and errors induced to radiation. In single event effect on SRAM-based FPGA are distinct from others because of its special structure and operation. This paper analyzes in detail diverse fault modes for SRAM- based FPGA in space applications, and investigates broadly corresponding fault-tolerant methods by taking the mainstream device in this type of FPGA as objects. Results show that we are able to effectively decrease the possibilities of the radiation - induced faults of SRAM-based FPGA by taking appropriate fault tolerant methods.