利用X射线衍射方法确定金属工艺表面的应力-应变关系

DETERMINATION OF SUPERFICIAL STRESS-STRAIN RELATIONSHIP WITH X-RAY DIFFRACTION TECHNIQUE

以塑性力学中的增量理论和Mises屈服准则为依据，提出了利用X射线衍射方法测量金属工艺表面应力－应变关系和屈服强度的方法采用无应变剥层技术将表层逐层剥离，利用上述方法可以测得应力－应变关系和屈服强度沿表面强化层或软化层深度方向的分布．

Based on the incremental theory of plasticity and Mises criterion for yielding, a method for determining-the stress-strain relationship aed yield strength of a metallic material sudece with Xray difFraction technique has been established in this article. In concert with strain free layer removal technique, the method can be employed to measure the depth distributions of stressistrain relationship and yield strength in a superficial strengthened or weakened layer.