摘要
场效应晶体管是现代微电子技术的重要组成部分。为制备氧化锌薄膜晶体管,分析了氧化锌的p型、n型掺杂特性,对p型掺杂进行了实验分析和理论探讨,比较了各种制备氧化锌薄膜晶体管的工艺特点,展示了ZnO在未来电子和光电子领域的潜在应用。
The field effect transistor is an important constituent part of modern micro-electronics. For the preparation of ZnO thin film transistor, in the present paper the properties of p-type doping and n-type doping of ZnO film are analyzed. The experiment result is analyzed and its theories are explored and discussed. Several kinds of preparation methods are analyzed, and the properties of the preparation methods of the ZnO films transistor are compared. The potential application of ZnO in the future electronic and opto-electronic fields is shown.
出处
《材料导报》
EI
CAS
CSCD
北大核心
2009年第5期96-99,共4页
Materials Reports
基金
国家自然科学基金资助项目(10874075)
湖北省教育厅重点科技项目基金资助项目(D20082203)
黄石市科技攻关计划项目基金资助项目(黄科技发成[2006]18号)
关键词
氧化锌
薄膜
P型掺杂
制备
zinc oxide, thin films, p-type doping, preparation